Thin Film Analysis by X-Ray Scattering
Mario Birkholz
9783527310524
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| Author(s) :- Mario Birkholz | Format :- Hardback |
| Publisher :- Wiley-VCH Verlag GmbH | Pub. Date :- 2005-11-15 |
| ISBN-13 :- 9783527310524 | |
| Dimensions :- 248 x 170 x 26 | |
| Weight :- 766 |
Description
With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films.
