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| Author(s) :- ASM International | Format :- Paperback |
| Publisher :- A S M International | Pub. Date :- 2022-07-30 |
| ISBN-13 :- 9781627084192 | |
| Pagination :- 461 pages | |
| Dimensions :- 231 x 286 x 31 | |
| Weight :- 1150 |
The theme for the 2021 conference was System-in-Package (SiP) technology. Papers include discussions on board and system level failure analysis; detecting counterfeit microelectronics; emerging failure analysis techniques and concepts; future challenges of failure analysis; and scanning probe analysis.