Electromigration in Metals
Sukharev Valeriy
9781107032385
onload="displayBookAvailableStatusC()"/>
Rating:
Rs. 54600.00
Delivery in 25 - 45 working days
Covid-19 Notice
Due to the current situation the Delivey will be delayed than the standard shipping period (21 working days)
Call our hotline 011 7 463 463
Additional Information
Add to wishlist
| Author(s) :- Sukharev Valeriy | Format :- Hardback |
| Publisher :- Cambridge University Press | Pub. Date :- 2022-05-12 |
| ISBN-13 :- 9781107032385 | |
| Pagination :- 430 pages | |
| Dimensions :- 176 x 251 x 27 | |
| Weight :- 978 |
Description
Learn to assess electromigration reliability, and design more resilient chips, from this comprehensive resource. Building from fundamental physics to advanced methodologies, this book enables the reader to develop highly reliable on-chip wiring stacks and power grids. This is an ideal text for materials scientists and chip design engineers.
